能譜透射電鏡 Talos F200S TEM
- 公司名稱 賽默飛世爾科技（中國）有限公司
- 品牌 FEI/賽默飛
- 型號
- 產地
- 廠商性質 生產廠家
- 更新時間 2025/3/21 10:50:39
- 訪問次數 300
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欲了解更多信息，請瀏覽公司網站：www.thermofisher.com 賽默飛世爾科技中國簡介賽默飛世爾科技進入中國發展已超過35年，在中國的總部設于上海，并在北京、廣州、香港、成都、沈陽、西安、南京、武漢、昆明等地設立了分公司，員工人數約為5000名。我們的產品主要包括分析儀器、實驗室設備、試劑、耗材和軟件等，提供實驗室綜合解決方案，為各行各業的客戶服務。為了滿足中國市場的需求，現有7家工廠分別在上海、北京、蘇州和廣州等地運營。我們在全國還設立了8個應用開發中心以及示范實驗室，將世界級的前沿技術和產品帶給中國客戶，并提供應用開發與培訓等多項服務；擁位于上海的中國創新中心，擁有有100多位專業研究人員和工程師及70多項專利。創新中心專注于針對垂直市場的產品研究和開發，結合中國市場的需求和國外先進技術，研發適合中國的技術和產品；我們擁有遍布全國的維修服務網點和特別成立的中國技術培訓團隊，在全國有超過2600名專業人員直接為客戶提供服務。我們致力于幫助客戶使世界更健康、更清潔、更安全。
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科學儀器
| 價格區間 | 面議 | 儀器種類 | 熱場發射 |
|---|---|---|---|
| 應用領域 | 環保,化工 |
能譜透射電鏡 Talos F200S TEM
能譜透射電鏡 Talos F200S TEM TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification
Talos F200S G2 Transmission Electron Microscope
The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.
Talos F200S G2 Transmission Electron Microscope advantages
The Thermo Scientific Talos F200S 200kV (S)TEM combines fast, multichannel, high-resolution (S)TEM imaging and precise compositional analysis to enable dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, the Talos (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.
Talos F200S G2 Transmission Electron Microscope features
Intuitive software
Features Thermo Scientific Velox Software for fast and easy acquisition and analysis of multimodal data.
Upgrade
Can be field upgraded to the Thermo Scientific Talos F200X (S)TEM.
Precise chemical composition data
Rapid, precise, quantitative EDS analysis using two in-column Thermo Scientific SDD Super-X Detectors with unique cleanliness, revealing nanoscale details.
Increased stability
Reduced environmental sensitivity thanks to the instrument enclosure, which moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.
Better image data
High-throughput (S)TEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.
Space for more
Add application-specific in situ sample holders for dynamic experiments.
Specifications
| HRTEM line resolution |
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| HRSTEM [nm] |
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| Total beam current FEG |
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| EDS system |
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| EDS energy resolution |
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| Fast EDS mapping |
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| EDS Net solid angle |
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