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【產品簡介】
【詳細說明】
常溫超級鉆石刀有兩種角度（35º和45º）可以選擇，鉆石刀的長度1.5mm-4mm，可以得到樣品的適宜厚度范圍在30-150nm。
1. 常溫超級鉆石刀45º
這款鉆石刀可以勝任一般常規的切片工作，在切片質量和使用壽命兩方面都有很好的表現。對于極硬的材料和易碎的材料（例如陶瓷），推薦使用此款鉆石刀。
2. 常溫超級鉆石刀35º
關于常溫超級鉆石刀的詳細特性，可以參考J.JESIOR的相關著作，在其作品中詳細描述了利用35º刀怎樣得到更好的切片。一直以來，大量的科學家認識到35º刀在Lowicryle（一般指K4M等包埋劑包埋的樣品）、脫鈣骨、牙齒等等材料的切片中發揮出色。大量的實驗證明，35º刀在軟的工業樣品（例如金屬和聚酯類）的切片中發揮的與硬的易碎樣品的切片一樣出色，例如半導體材料（Si，GaAs等），超導氧化物，納米晶體陶瓷等等材料。
Rat muscle (Quadriceps) x 23’000
Werner Graber, Anatomisches Institut, Bern.
產品選購：
貨號 | 產品名稱 | 角度 | 長度 |
15-UL | Ultra Diamond Knife | 35° | 1.5mm |
18-UL | Ultra Diamond Knife | 35° | 1.8mm |
21-UL | Ultra Diamond Knife | 35° | 2.1mm |
24-UL | Ultra Diamond Knife | 35° | 2.4mm |
27-UL | Ultra Diamond Knife | 35° | 2.7mm |
30-UL | Ultra Diamond Knife | 35° | 3.0mm |
35-UL | Ultra Diamond Knife | 35° | 3.5mm |
40-UL | Ultra Diamond Knife | 35° | 4.0mm |
15-US | Ultra Diamond Knife | 45° | 1.5mm |
18-US | Ultra Diamond Knife | 45° | 1.8mm |
21-US | Ultra Diamond Knife | 45° | 2.1mm |
24-US | Ultra Diamond Knife | 45° | 2.4mm |
27-US | Ultra Diamond Knife | 45° | 2.7mm |
30-US | Ultra Diamond Knife | 45° | 3.0mm |
35-US | Ultra Diamond Knife | 45° | 3.5mm |
40-US | Ultra Diamond Knife | 45° | 4.0mm |
參考文獻：
J.C. Jésior: Use of lowangle diamond knives leads to improved ultrastructural preservation of ultrathin sections. Scanning Microscopy Supplement 3, pp. 17-153, 1989. Scanning Microscopy International,
Chicago (AMF O’Hare) IL 6066 USA.
L. Edelmann: Freezesubstitution and the preservation of diffusable ions. Journal of Microscopy, Vol. 161, pp. 217-228, 1991.
G. Mahon and T. Malis: Ultramicrotomy of Nanocrystalline Materials. Microscopy Research and Technique, Vol. 31, pp. 267-274, 1995.
S.R. Glanvill: Ultramicrotomy of Semiconductors and Related Materials. Microscopy Research and Technique, Vol. 31, pages 267-274, 1995.
P. Swab abd R.E. Klinger: Preparation of multilayer coatings for crosssectional Microanalysis by Ultramicrotomy. Mat. Res. Soc. Symp. Proc. Vol. 115, pages 229-234, 1989.
P. Swab: Ultra-microscopy of Diamond Films for TEM CrossSection Analysis. Microscopy Research and Technique, Vol. 31, pp. 308-310, 1995.
C. Quintana: Ultramicrotomy for Cross-sections of Nanostructure. Micron Vol. 28, No. 3, pages 217-219, 1997.
Y. Maniette: Microtomy, a convenient method for preparing TEM samples in ceramic science. Journal of Material Science Letters 9, pages 48-50, 1990.
P. Schubert-Bischoff and T. Krist: Fast crosssectioning technique for thin films by Ultramicrotomy. Microscopy and Microanalysis, proceedings, page 359, 1997.
J.L. GuerquinKern, T.D. Wu, C. Quintana, A. Croisy: Progress in analytical imaging of the cell by dynamic secondary ion mass spectroscopy (SIMS microscopy). BBA 1724,