ISO 10474-3.1.B 歐標(biāo)試塊（18851-I）
| 參考價(jià) | ￥ 7500 |
| 訂貨量 | ≥1 |
- 公司名稱 上海越磁電子科技有限公司
- 品牌
- 型號(hào) ISO 10474-3.1.B
- 產(chǎn)地
- 廠商性質(zhì) 經(jīng)銷商
- 更新時(shí)間 2017/12/4 11:03:43
- 訪問次數(shù) 3905
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NO. E11-1-13-56X
Date .Apr.19,2011
EISHIN KAGAKU CO.,LTD
NON-DESTRUCTIVE TESING MATERIALS,EQUIPMENTS & SYSTEMS
Test Report according to ISO 10474-3.1.B,JIS G 0415-3.1.B
Eishin Type 1 reference test blocks meet the requiements of ISO 3452-3:1998（E）,JIS Z 2343-3:2001
Manufacturer,S Inspection Certificate
This is to certify that the undermentioned product has duly been tested inspected with the following results which are proven as satisfactory
Descriptions of product
| Type 1 TP-30um | |
| Serial NO | 56X |
| Depth | 31.5um |
| Width （TARGET Value） | 1.5um |
Application: The Test Panels are applied to confirm the sensitivity level of the penetrat and penetrant inspection system
Safekeeping: Be careful about the coating removal and crack rise due to provide the bending mechanical and thermal energy to the Test Panel.
Test Panel after use will be reproduced with providing post cleaning and keep in an adjunct box,protective envelope or desiccator
備注：全套18851-I試塊共4個(gè)規(guī)格，分別為10um,20um,30um,50um,其中每個(gè)規(guī)格需購買套裝A、B兩塊配合使用，每套配備圖片卡。
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